Scan-Probe Image Collection
This page serves as a tutorial to complete the Scan-Probe image collection technique. For information on how to complete Fullfield image collection, see the FullField_Description
What is Scan Probe Imaging?
Scan Probe Imaging is a type of X-ray imaging that takes a "raster scan" (z-pattern) of images to create a picture. This type of imaging is collected sequentially and can take minutes to hours to complete. To create an image, an X-ray beam is focused onto the sample by the focusing optic and then detected after hitting the sample by the Small Angle X-Ray Scattering mapping, or SAXS. The image is then viewed through software such as InstantPlot.
About the Sample Holder
The sample holder connects to a kinematic mount, which is connected to an L-bracket that is attached to a breadboard. The kinematic mount, L-bracket and breadboard are standardized and provided by CHESS while the sample holder is customizable and needs to be printed using one of the provided 3D print files or provided by the consumer. The sample holders provided by CHESS can hold multiple samples at the same time, providing at least 24 hours of scanning time. Below are examples of a sample holder designed with a specific geometry to be used this fall and a sample holder that will be used for calibrations and standards. All designs created in SolidWORKS.
Sample stage with breadboard
Sample Holder (front)
Sample Holder (back)
Calibration/Standards Sample Holder (front)
Calibration/Standards Sample Holder (back)
Sample Holder, kinematic base and L-bracket assembled
Drawing of the Sample Holder
Drawing of the Calibration/Standards Sample Holder
Drawing of the L-bracket
Examples of Sample Holders